报告题目：Power Device Packaging and Reliability

报告人：Josef Lutz，a German physicist and electrical engineer

主持人：苟斌 副教授，西南交通大学电气工程学院

时间：2023年5月26日（星期五）下午14：00

地点：犀浦校区10号教学楼（X10832教室）

内容简介：

The lecture will start with an overview on power device packages: Discrete molded packages, power modules and their recent variants. Power devices are exposed to high stress in application. Some fatigue processes and fatigue detection will be addressed, reliability test methods with focus on power cycling are described.

主讲人简介：

Josef Lutz (born 1954 in Ellwangen (Jagst)) is a German physicist and electrical engineer. In 1973, Lutz received his high-school diploma from the Theodor-Heuss-Gymnasium, Aalen. Josef Lutz studied Physics at the University of Stuttgart, from 1983 he was with Semikron Elektronik, in Nuremberg. He invented the Controlled Axial Lifetime (CAL) diode and holds several patents in the field of fast diodes. In 1999 he graduated as PhD in electrical engineering at the university of Ilmenau. Since August 2001 he is a Professor for Power Electronics and Electromagnetic Compatibility at the Chemnitz University of Technology.

He is a senior member of IEEE and serves in several international committees (PCIM, EPE, ISPS, CIPS) He is a member of the advisory board of the Journal Microelectronics Reliability. His main publication is the book "Semiconductor Power Devices - Physics, Characteristics, Reliability", printed in German (2006, 2012), in English (2011, 2018), and in Chinese (2013). His focus of research is on power semiconductor devices, ruggedness, and reliability. In 2005, he was elected as an honorary professor at the North Caucasian Technical University in Stavropol. Josef Lutz is among the top 1% of the world's most cited researchers in their field.

请相互转告，欢迎全校师生参加。

电气工程学院

2023年5月23日